Reliability Test Equipments

Strict quality control and various tests in reliability allow us to guarantee the highest quality in our products. All our products are held to our rigorous standards and tested using our vast array of test equipment, including electrical characteristic test machines, thermal shock testers, pressure controlled testers (PCT), high temperature reverse bias (HTRB) testers, x-ray fluoroscopy devices, DE-CAP analysis equipment, thermal resistance junction testers (RTHJ), and the like.

 

  • ESD Electrostatic Discharge Tester

    {"title":"ESD Electrostatic Discharge Tester", "image":"images/eris/quality/equipments/reliability_test/qamode10.jpg", "data":"This is to simulate the electrostatic capacity to test the electrostatic shock of diodes for ensuring high quality."}

  • HTRB (High Temperature Reverse Bias) Equipment

    {"title":"HTRB (High Temperature Reverse Bias) Equipment", "image":"images/eris/quality/equipments/reliability_test/qamode16.jpg", "data":"This is to test diodes at high ambient temperature under the regular operation in a long period. The device is to test the noise figure status of diodes during their operation."}

  • RTHJ (Thermal Resistance Junction) Tester

    {"title":"RTHJ (Thermal Resistance Junction) Tester", "image":"images/eris/quality/equipments/reliability_test/qamode19.jpg", "data":"Measure thermal resistance, Rth, by delta VF reading among Tj, Ta, Tc, T and derived K instant (℃/W). Dynamic thermal resistance reveal can monitor actual thermal consumption."}

  • Thermal Shock Test Chamber

    {"title":"Thermal Shock Test Chamber", "image":"images/eris/quality/equipments/reliability_test/qamode4.jpg", "data":"This is a reliability test to check if diodes can sustain the transient environmental temperature change from extreme low to high under the condition of regular operation."}

  • Push-Pull Force Gauge

    {"title":"Push-Pull Force Gauge", "image":"images/eris/quality/equipments/reliability_test/qamode18.jpg", "data":"This is to test the tensile status of solder lead and die bonding before packaging."}

  • High Pressure Accelerating Life Tester

    {"title":"High Pressure Accelerating Life Tester", "image":"images/eris/quality/equipments/reliability_test/qamode11.jpg", "data":"This is to test the quality of diode packages by the condition of constant vapor pressure and humidity."}

  • H3TRB (High Humidity High Temperature Reverse Bias) Testing

    {"title":"H3TRB (High Humidity High Temperature Reverse Bias) Testing", "image":"images/eris/quality/equipments/reliability_test/qamode22.jpg", "data":"High humidity & high temperature reverse bias testing is to evaluate the reliability of diodes by measuring and monitoring the states of their leakage currents in high temperature, high humidity and high bias voltage environment."}